Course EIT-ISE-651-K-4
Technology and Design of Integrated Mixed-Signal Circuits and Systems (TESYS) (2V+2L, 5.0 LP)
Course Type
SWS | Type | Course Form | CP (Effort) | Presence-Time / Self-Study | |
---|---|---|---|---|---|
- | K | 5.0 CP | |||
2 | V | Lecture | 28 h | 45 h | |
2 | L | Project work | 28 h | 49 h | |
(2V+2L) | 5.0 CP | 56 h | 94 h |
Basedata
SWS | 2V+2L |
---|---|
CP, Effort | 5.0 CP = 150 h |
Position of the semester | 1 Sem. in SuSe |
Level | [4] Bachelor (Specialization) |
Language | [EN] English |
Lecturers | |
Area of study | [EIT-ISE] Integrated Sensor Systems |
Livecycle-State | [NORM] Active |
Contents
- Manufacturing technologies and -methods for integrated circuits (CMOS (bulk, SOI), BiCMOS)
- Device spectrum, process variations, yield, tolerances and soft-faults
- Principles of layout-design for analog and mixed-signal circuits (matched-layout)
- Design methodology and tools of computer-aided design for integrated mixed-signal electronics (Hierarchical design, mixed-mode, mixed-signal, AHDLs)
- Simple (SPICE-level 1) and advanced device models (e.g., BSIM-models)
- Rehearsal of basic circuits & building blocks for integrated analog electronics (References etc.)
- Design techniques for applications-specific cells and blocks: selection, sizing, simulation, layout, extraction, post-layout simulation for application-specific (single-ended and fully-differential) operational amplifiers (OpAmp/OTA), RC-, GmC-, SC-Filters, AD/DA-converters, VCO etc.
- Extension to analysis of temperature drift and statistical influence from manufacturing tolerances (parametric, Monte-Carlo, and corner analysis etc.)
- Modeling, design and layout realization of digital circuits as components in integrated mixed-signal electronics, related signal integrity issues
- Advanced issues: Noise, analog synthesis, testing, reconfiguration, eigen- or self calibration, self-monitoring/-repair, adaptation
Literature
- Phillip E. Allen, Douglas R. Holberg, CMOS Analog Circuit Design, Oxford University Press, 2nd ed., 2002
- R.C. Jaeger, T.N. Blalock: Microelectronic Circuit Design. McGrawHill, 2003, ISBN 007-232099-0
- Kenneth R. Laker, Willy M.C. Sansen, Design of Analog Integrated Circuits and Systems, MacGrawHill, 1994.
- R. Jacob Baker, Harry W. Li, David E. Boyce, CMOS Circuit Design, Layout, and Simulation, IEEE Press, 1999
- Hastings, The Art of Analog Layout, Prentice Hall, 200
- Jaeger, Introduction to Microelectronic Fabrication, Prentice Hall 2002
- Geiger/Allen/Strader, VLSI Design Techniques for Analog and Digital Circuits
- Grey/Meyer, Analysis and Design of Analog Integrated Circuits
Materials
- Lectures slides (PDF) and Lab guide slides (PDF)
- Online help of CAE system
- Web resources
Registration
Registration in the first lecture
Requirements for attendance (informal)
Modules:
- [EIT-ISE-105-M-2] Electrical Measurement Technique I (M, 4.0 LP)
- [EIT-ISE-701-M-2] Electronics I (M, 6.0 LP)
- [EIT-ISE-702-M-3] Electronics II (M, 4.0 LP)
Requirements for attendance (formal)
None
References to Course [EIT-ISE-651-K-4]
Module | Name | Context | |
---|---|---|---|
[EIT-ISE-651-M-4] | Technology and Design of Integrated Mixed-Signal Circuits and Systems (TESYS) | P: Obligatory | 2V+2L, 5.0 LP |